Time & Frequency Domain Simulation-to-Measurement Techniques by Mike Resso
Straight from Dgcon 2017 - The Main Signal & Power Integrity Event In Israel!
http://www.dgcon.info/
Initiated by Dgtronix, Dgcon is the first Israeli conference targeted to provide the necessary technical knowledge, covering many aspects of Hardware Design.
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The Lecture:
Time & Frequency Domain Simulation-to-Measurement Techniques for Characterizing a USB Type-C Reference Channel
USB Type-C is one of the more challenging architectures for digital design engineers due to the extreme rise time of the digital signals it’s meant to carry. This, combined with the small physical size of this high-density reversible connector, increases the risk that design engineers will encounter unforeseen interoperability issues at the fundamental physical layer. These issues can be avoided by leveraging measurements and simulations to adequately debug and characterize the performance-controlling interconnect features and fabrication tolerances. This presentation discusses a step-by-step process that signal integrity engineers can follow to ensure their success in designing with USB Type-C devices. It deals with the basics of simulation/test, including some tips and techniques for dealing with S-parameters. While this presentation uses a design case study of a USB Type-C channel, this real world practical approach can be used for any high speed digital interconnect design.
The Expert:
Mike Resso is the Signal Integrity Application Scientist in the Component Test Division of Keysight Technologies and has over twenty-five years of experience in the test and measurement industry. His background includes the design and development of electro-optic test instrumentation for aerospace and commercial applications. His most recent activity has focused on the complete multiport characterization of high speed digital interconnects using Time Domain Reflectometry and Vector Network Analysis. He has authored over 30 professional publications including a book on signal integrity. Mike has been awarded one US patent and has twice received the Agilent “Spark of Insight” Award for his contribution to the company. He received a Bachelor of Science degree in Electrical and Computer Engineering from University of California.
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