Next level Board production by improved efficiency and reliability - Flying Probe Tester FA1815-20
As semiconductor technology continues to evolve, high performance boards are increasing in density. This is causing inspection processes to increase. The FA1815 has improved inspection efficiency and reliability compared the previous model.
Equipped with newly developed micro-current detection technology, micro currents as small as 100 pA (10 V 100 GΩ) can be detected at higher speed and with higher accuracy than the previous model. High insulation resistance can be inspected with less stress even on high-density printed circuit boards of probe cards, which are required for the most advanced semiconductor wafer inspection.
Specializing in the inspection of probe heads and interposers used in probe cards, this tester provides refined insulation inspection by optimizing the rigidity of the mechanism and inspection algorithm.
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